Eval Program Suite
Eval14 and eval15 are integration methods for single crystal X-ray
diffraction on area detectors.
Both methods use knowledge about the exact experimental setup.
- Eval14 applies boxsummation (BPB) with predicted reflection boundaries.
- Eval15 applies profile fitting with predicted reflection profiles
The eval15 method is described in:
A.M.M. Schreurs, X. Xian and L.M.J. Kroon-Batenburg
EVAL15: a diffraction data integration method based on ab initio predicted profiles
J. Appl. Cryst. 43, (2010) 70-82
A reprint
(Copyright © International Union of Crystallography
J. Appl. Cryst. 43, (2010) 70-82) can be found
here (PDF file, 1.1 Mb).
The eval14 method is described in:
A.J.M. Duisenberg, L.M.J. Kroon-Batenburg and A.M.M. Schreurs
An intensity evaluation method: EVAL-14
J. Appl. Cryst. 36, (2003) 220-229.
A reprint
(Copyright © International Union of Crystallography
J. Appl. Cryst. 36, 220-229) can be found
here (PDF file, 820 kb).
Availability
The package is available, free of charge, for academic purposes.
The latest version was build at 13 September 2023.
Download- and installation instructions will be sent after the reception
of a filled-in license form.
A username/password is needed to access the download directory.
Documentation
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