A.M.M. Schreurs.
A history of 3d-visualization in Crystallography
NVK Symposium 2010
5 november 2010, Amsterdam
A.M.M. Schreurs.
X8 Proteum: Fine tuning and data integration with EVAL15
17th Bruker AXS Users' Meeting
20-22 september 2010, Karlsruhe
A.M.M. Schreurs.
Solving overlap problems in diffraction data with EVAL15
CW studiegroep Kristal- en Struktuuronderzoek
21 april 2009, Lunteren
A.M.M. Schreurs.
EVAL15: The Software and Examples.
14th Bruker AXS Users' Meeting
18-20 september 2006, Bruker AXS, Delft
A.M.M. Schreurs.
EVAL15: Accurate Integrated X-Ray Diffraction Intensities through
Profile Prediction. Examples.
EPSRC National Crystallography Service
(Engineering and Physical Sciences Research Council)
Advanced Techniques Workshop
11-13 september 2006, University of Southampton (U.K.)
L.M.J. Kroon-Batenburg and A.M.M. Schreurs.
EVAL15: Accurate Integrated X-Ray Diffraction Intensities through
Profile Prediction. An artificial twin.
27 july 2006, University of Southampton (U.K.)
A.J.M. Duisenberg and A.M.M. Schreurs.
EVALCCD and recent developments.
EPSRC National Crystallography Service
(Engineering and Physical Sciences Research Council)
Advanced Techniques Workshop
13-15 september 2004, University of Southampton (U.K.)
L.M.J. Kroon-Batenburg and A.M.M. Schreurs.
EVAL15: Accurate Integrated X-Ray Diffraction Intensities through
Profile Prediction. The Principles.
CW studiegroep Kristal- en Struktuuronderzoek
31 march april 2003, Lunteren
A.J.M. Duisenberg and A.M.M. Schreurs.
EPSRC National Crystallography Service
(Engineering and Physical Sciences Research Council)
Advanced Techniques Workshop
10-12 september 2002, University of Southampton (U.K.)
A.M.M. Schreurs.
The PhiChi method
Bruker-Nonius User Meeting 2002
21-22 may 2002, Bonn
Albert J.M. Duisenberg, Rob W. Hooft and
Antoine M.M. Schreurs
Accurate Cell Dimensions from Area Detector Rotation Images
18th European Crystallographic Meeting
15-20 august 1998, Prague.